Material Thickness Measurement Device A1270
No contact medium needed! Non-contact thickness measurement of the substrate from the coating.
Ultrasound is generated within the material through electromagnetic induction, so no contact medium is required. Non-contact is possible from the coating film. 【Features】 ◆ SH wave probe adopted ◆ No coupling agent required ◆ Less affected by surface conditions ◆ 2000 data memory ◆ Data can be transferred to a PC via USB ◆ Correlation process analysis of signals is possible
- Company：日本マテック
- Price：Other
